Maximum sample height: 38 mm (when used with LVNU5AI U5AI nosepiece and LV-S32 3x2 stage / LV-S64 6x4 stage)
* 73 mm when used with one column riser 12V50W internal power source for dimmer, coarse and fine adjustment knobs
Left: coarse and fine adjustment / Right: fine adjustment, 40 mm stroke Coarse adjustment: 14 mm/turn (with torque adjustment, refocusing mechanism)
Fine adjustment: 0.1 mm/turn (1 μm/graduation) Stage mounting hole intervals: 70 x 94 (fixed by 4-M4 screw)
LV-S32 3x2 stage (Stroke: 75 x 50 mm with glass plate) ESD compatible
LV-S64 6x4 stage (Stroke: 150 x 100 mm with glass plate) ESD compatible
LV-S6 6x6 stage (Stroke: 150 x 150 mm) ESD compatible
CFI eyepiece series
Industrial Microscope CFI60-2/CFI60 optical system Objective lens series: Combinations in accordance with the observation method
1000 to 10V, within 0.2 sec. (excluding certain accessories)
Eclipse LV150N - Digital imaging combined with advanced
A manual, nosepiece type microscope which meets the various needs of observation, inspection, research and analysis across a wide range of industrial fields. Higher NA and a longer working distance than ever before means superior optical performance and efficient digital imaging.
Max. sample size: 150 x 150 mm.
Liquid Crystal Displays (lcd)
Telecom & Electronics
Mobile phones, shavers & watches
Benefits & features
Dedicated reflected illumination models
Modularized microscope body applicable with various observations and tasks
Compatible with brightfield, darkfield, simple polarizing, DIC, epifluorescence and two-beam interferometry observations. It supports diverse and advanced research, analysis and inspection.
Compatible observation methods:
* Select suitable lens for each observation
LV-S32 3x2 stage (Stroke: 75 x 50 mm with glass plate)
*Can be fitted with LV-S32SPL ESD plate
LV-S6 6x6 stage (Stroke: 150 x 150 mm)
*Can be fitted with LV-S6WH wafer holder / LV-S6PL ESD plate
LV-SRP P revolving stage
P-GS2 G stage 2 (Used with stage adapter LV-SAD)
Newly developed CFI60-2 series
Newly developed CFI60-2 series provides the ultimate in long working distance levels and the most advanced chromatic aberration in a light weight body
CFI60-2 series offers higher NA and longer working distances than ever before.
Objectives for brightfield observation (epi)
Easy digital imaging
Information about the objective in use is detected and displayed on the camera control unit. In addition, the information is automatically converted into appropriate calibration data when changing magnification.
Digital Camera System for Microscopy Digital Sight Serie