Mitutoyo Surface Measuring System
Mitutoyo Surface Measuring System
Model: CV-2100
Brand: mitutoyo
Origin: Japan
概括
The Contracer CV-2100 contour measuring instrument provides remarkable operability and functionality revolutionizing contour measuring machines for faster, easier and more accurate measurements. This measuring instrument’s Z-axis detector measuring range of 50mm accommodates larger workpieces.
The Mitutoyo Contracer CV-2100 contour measuring instrument provides highly accurate, highly efficient measurements that is easy to set up. This measuring instrument is equipped with a drive unit inclination mechanism that enables inclined-plane measurement to accurately measure difficult to measure workpiece features. The Digital ARC Scale directly tracks the arc trajectory of the stylus tip so the most accurate compensation can be applied to the scale output for both higher accuracy and resolution.
- Quick-release grip handle allows for rapid traverse in column Z-axis for CV-2100M4
- Key operation buttons are mounted onto the X-axis drive unit, eliminating a wired remote box
- X-axis traverse speed, up to 20mm/s, allows for quick positioning and set-up time
- Motorized stylus movement means high-volume repetitive measurements are now capable with part programming
- CV-2100N4 model can be easily mounted to optional manual column stand or custom fixture supplied by end user
| Range X-Axis: | 4" / 100mm |
|---|---|
| Resolution X-Axis: | 3.93μin / .1μm |
| Measuring Method: | Linear encoder |
| X-axis Drive speed (software): | 0 - .79in/s / 0 - 20mm/s |
| Drive method (Column): | Manual coarse/fine feed |
| Measuring Speed: | .00078 - .2 in/s / .02 -5 mm/s |
| Measuring direction: | Forward/Backward |
| Detector Z-Range Resolution: | 3.93μin / .1μm |
| Measuring force: | 30 ± 10mN |
| Stylus tip: | 1000 radius μin / 25 radius μm |
| Z1-axis detector measuring range: | 2" / 50mm |
| Z1-axis detector measuring method: | RT detector |
应用
The Mitutoyo Contracer CV-2100 contour measuring instrument provides highly accurate, highly efficient measurements that is easy to set up. This measuring instrument is equipped with a drive unit inclination mechanism that enables inclined-plane measurement to accurately measure difficult to measure workpiece features. The Digital ARC Scale directly tracks the arc trajectory of the stylus tip so the most accurate compensation can be applied to the scale output for both higher accuracy and resolution.
- Quick-release grip handle allows for rapid traverse in column Z-axis for CV-2100M4
- Key operation buttons are mounted onto the X-axis drive unit, eliminating a wired remote box
- X-axis traverse speed, up to 20mm/s, allows for quick positioning and set-up time
- Motorized stylus movement means high-volume repetitive measurements are now capable with part programming
- CV-2100N4 model can be easily mounted to optional manual column stand or custom fixture supplied by end user
规格
| Range X-Axis: | 4" / 100mm |
|---|---|
| Resolution X-Axis: | 3.93μin / .1μm |
| Measuring Method: | Linear encoder |
| X-axis Drive speed (software): | 0 - .79in/s / 0 - 20mm/s |
| Drive method (Column): | Manual coarse/fine feed |
| Measuring Speed: | .00078 - .2 in/s / .02 -5 mm/s |
| Measuring direction: | Forward/Backward |
| Detector Z-Range Resolution: | 3.93μin / .1μm |
| Measuring force: | 30 ± 10mN |
| Stylus tip: | 1000 radius μin / 25 radius μm |
| Z1-axis detector measuring range: | 2" / 50mm |
| Z1-axis detector measuring method: | RT detector |