Scanning Electron Microscope EM-30N
Scanning Electron Microscope EM-30N
Model: EM-30N, EM-30AXN
Brand: Coxem
Origin: Korea
概括
EM-30N, which is a product of COXEM ’s steady investment for technology and development with a view to the era of nano-mechatronics, can deliver clear images without noise even at high magnification and scan an even wider area with its panorama feature. Also, its full compatibility with EDS delivers optimized performance. Satisfactory both in performance and price, EM-30N will shine in all research areas and deliver superb results to the development and utilization of advanced technology.
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EM-30N |
EM-30AXN |
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Magnification |
15-150,000X |
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Spatial Resoultion |
<5nm at 30kV |
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Vacuum Mode |
HV (Standard) |
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Acceleration Voltage |
1 - 30kV (adjustable in 1kV scale) |
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Electron Source |
Pre-Centered Tungsten Filament |
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Detector |
SED(DP), BSED(DP) |
SED(DP), BSED(DP), EDS |
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Sample Size |
70mm (W) x 45mm (H) |
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X-Y/T Traverse |
35x35mm / 0 - 45º |
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Automation |
Focus, Filament, Brightness/Contrast |
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Data Output Format |
jpg, tiff, BMP |
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Dimensions |
400 x 600 x 550 mm |
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Weight |
85 kgs |
95 kgs |
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Options |
STEM CoolStage Panorama 2.0 30mm Active Size Compact Type EDS (Particle Analysis) 30mm Active Size Compact Type EDS (MPO included) |
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应用
规格
|
|
EM-30N |
EM-30AXN |
|
Magnification |
15-150,000X |
|
|
Spatial Resoultion |
<5nm at 30kV |
|
|
Vacuum Mode |
HV (Standard) |
|
|
Acceleration Voltage |
1 - 30kV (adjustable in 1kV scale) |
|
|
Electron Source |
Pre-Centered Tungsten Filament |
|
|
Detector |
SED(DP), BSED(DP) |
SED(DP), BSED(DP), EDS |
|
Sample Size |
70mm (W) x 45mm (H) |
|
|
X-Y/T Traverse |
35x35mm / 0 - 45º |
|
|
Automation |
Focus, Filament, Brightness/Contrast |
|
|
Data Output Format |
jpg, tiff, BMP |
|
|
Dimensions |
400 x 600 x 550 mm |
|
|
Weight |
85 kgs |
95 kgs |
|
Options |
STEM CoolStage Panorama 2.0 30mm Active Size Compact Type EDS (Particle Analysis) 30mm Active Size Compact Type EDS (MPO included) |
|