스캔닝 전자 현미경 (SEM)
스캐닝 전자 현미경
Scanning Electron Microscope Full Size CX-200Plus
ID: CX-200Plus
Scanning Electron Microscope EM-30N
ID: EM-30N, EM-30AXN
COXEM Cross Section Polisher CP-8000+
ID: CP-8000+
Scanning Electron Microscope SELPA for Particle Analysis
ID: SELPA
Optional for SEM: EDS Detector
ID: EDS Detector
