X-RAY NIKON XT V 130C
Model: XT V 130C
Brand: Nikon
Origin:
Summary
The X-RAY NIKON XT V 130C is range comprises world-class X-ray and CT systems for non-destructive inspection of electronic components (PCBs, BGAs, chips, and much more). an X-ray computed tomography (CT) system produced by Nikon. It is designed for non-destructive testing and analysis of various materials, including metals, plastics, ceramics, and composites. The system uses a micro-focus X-ray source and a high-resolution detector to capture 2D X-ray projections of the object at multiple angles allowing for detailed inspection of the internal structure and defects of the object. The system has a maximum object size of 130mm in diameter and 150mm in height and is capable of producing voxel sizes as small as 1.9 microns. It also has various imaging modes, including high-speed scanning, high-resolution imaging, and helical scanning. The X-RAY NIKON XT V 130C is commonly used in industries such as aerospace, automotive, electronics, and medical devices for quality control and failure analysis.
With sub-micron feature recognition, the XT V system range meets today’s need for high-performance, non-destructive inspection of complex electronic components. Nikon’s Xi Nanotech X-ray source paired with industry-leading flat panel detectors produces best-in-class image quality, with seamless transition between 2D and 3D inspection.
Nikon’s market-leading Xi Nanotech X-ray microfocus source is unique due to its exclusive integral generator design and unparalleled 160kV maximum energy and 20W true-target power.
High. Contrast Filter reveals hidden details in the radiography image by providing outstanding image quality of both high and low contrast areas in a single clear image. Operators can now identify all aspects of the sample more quickly than ever before, optimizing and increasing their productivity.
With sub-micron feature recognition, the XT V system range meets today’s need for high-performance, non-destructive inspection of complex electronic components. Nikon’s Xi Nanotech X-ray source paired with industry-leading flat panel detectors produces best-in-class image quality, with seamless transition between 2D and 3D inspection.
Nikon’s market-leading Xi Nanotech X-ray microfocus source is unique due to its exclusive integral generator design and unparalleled 160kV maximum energy and 20W true-target power.
High. Contrast Filter reveals hidden details in the radiography image by providing outstanding image quality of both high and low contrast areas in a single clear image. Operators can now identify all aspects of the sample more quickly than ever before, optimizing and increasing their productivity.
